Zaid, Gabriel, Lilian Bossuet, François Dassance, Amaury Habrard, and Alexandre Venelli. “Ranking Loss: Maximizing the Success Rate in Deep Learning Side-Channel Analysis”. IACR Transactions on Cryptographic Hardware and Embedded Systems 2021, no. 1 (December 3, 2020): 25–55. Accessed January 24, 2025. https://icscm.ub.rub.de/index.php/TCHES/article/view/8726.